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Editorial Board

Editor in Chief:

P. Ladevèze, Université Paris-Saclay, Ladeveze@ens-paris-saclay.fr


Associate Editors:

Francisco Chinesta, Ecole Centrale Nantes, France,  Francisco.Chinesta@ec-nantes.fr  

Ramon Codina, Universitat Politècnica de Catalunya, Spain, ramon.codina@upc.edu

Alberto Corigliano, Politecnico de Milano, Italy, alberto.corigliano@polimi.it

Elias  Cueto, Universidad de Zaragoza, Spain, ecueto@unizar.es

Roger Ghanem, University of Southern California, USA, ghanem@usc.edu

Jörg Schröder, University Duisburg-Essen, Germany, j.schroeder@uni-due.de

Kenjiro Terada, Tohoku University , Japan, tei@irides.tohoku.ac.jp

 

Editorial Board:

O. Allix, ENS Cachan, France, allix@lmt.ens-cachan.fr

F. Auricchio, University of Pavia, Italy, auricchio@unipv.it

S. Bordas, University of Luxembourg, Luxembourg, stephane.bordas@uni.lu

T. Burczynski, Institute of Fundamental Technological Research, Polish Academy of Sciences, Poland, tburczynski@ippt.pan.pl

C. Cartensen, Humboldt University of Berlin, Germany, cc@math.hu-berlin.de

J-S. Chen, University of California, San Diego, USA, jsc137@ucsd.edu

L. Demkowicz, University of Texas at Austin, USA, leszek@ices.utexas.edu

J. Dolbow, Duke University, USA, john.dolbow@duke.edu

C. Farhat, Stanford University, USA, cfarhat@stanford.edu

J. Fish, Columbia University, USA, fishj@columbia.edu

F. Fritzen ,University of Stuttgart, Germany, fritzen@mechbau.uni-stuttgart.de

D. Givoli, Technion-Israel Institute of Technology, Israel, givolid@aerodyne.technion.ac.il

S. Ghosh, Johns Hopkins University, USA, sghosh20@jhu.edu

M. Geers, Technical University Eindhoven, The Netherlands, M.G.D.Geers@tue.nl

Ch. Hellmich, Vienna University of Technology, Wien, Austria, christian.hellmich@tuwien.ac.at

A. Huerta, UPC, Spain, antonio.huerta@upc.edu

A. Ibrahimbegovic, ENS Cachan, France adnan.ibrahimbegovic@utc.fr

S. Idelsohn, Polytecnical University of Cataluña, Spain sergio@cimne.upc.edu

T. Kvamsdal, Norwegian University of Science and Technology, Trondheim, Norway, trond.kvamsdal@ntnu.no

P. Letallec, Ecole Polytechnique Palaiseau, France, patrick.letallec@polytechnique.fr

G. Lubineau, KAUST, Saudi Arabia, gilles.lubineau@kaust.edu.sa

Y. Maday, University Pierre et Marie Curie, France, Maday@ann.jussieu.fr

H. Mang, Vienna Institute of Technology, Austria, herbert.mang@tuwien.ac.at

N. Moes, Ecole Centrale Nantes, France, nicolas.moes@ec-nantes.fr

C. A. Mota Soares, University of Lisbon, Portugal, carlosmotasoares@dem.ist.utl.pt

R. Ohayon, CNAM Paris, France, roger.ohayon@cnam.fr

M. Papadrakakis, University of Athens, Greece, mpapadra@central.ntua.gr

A. Patera, Massachusetts Institute of Technology, USA, patera@MIT.EDU

U. Perego, Polytechnical University of Milan, Italy, umberto.perego@polimi.it

G. Peric Swansea University, UK, D.Peric@swansea.ac.uk

S. Perotto, Polytechnical University of Milan, Italy, simona.perotto@polimi.it

JP Ponthot, Liege University, Belgium, JP.Ponthot@ULiege.be

S. Prudhomme, Politectnical University of Montreal, Canada, serge.prudhomme@polymtl.ca

E. Rank, Technical University Munich, Germany, ernst.rank@tum.de

K. Runesson, Chalmers University of Technology, Sweden, Kenneth.Runesson@chalmers.se

B. Sluys, Delft University of Technology,  The Netherlands, L.J.Sluys@tudelft.nl

P. Steinmann, University of Erlangen, Germany, steinmann@ltm.uni-erlangen.de

S. Tang, Peking University, Peking, China, maotang@pku.edu.cn

P. Trovalusci, Sapienza Università di Roma, Italy, patrizia.trovalusci@uniroma1.it

P. Wriggers, Leibniz University Hannover, Germany, wriggers@ikm.uni-hannover.de

J. Yvonnet, Gustave Eiffel University, Champs-sur-Marne, France, julien.yvonnet@univ-Eiffel.fr

T. Zhodi, University of California, USA, zohdi@me.berkeley.edu